[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Single-event upset responses of dual- and triple-well designs at advanced planar and FinFET technologies
Zhang, Hangfang, Jiang, Hui, Assis, Thiago R., Ball, Dennis R., Chatterjee, Indranil, Narasimham, Balaji, Nsengiyumva, Patrick, Massengill, Lloyd W., Bhuva, Bharat L.Year:
2016
Language:
english
DOI:
10.1109/RADECS.2016.8093171
File:
PDF, 694 KB
english, 2016