[IEEE 2017 IEEE II International Conference on Control in Technical Systems (CTS) - St. Petersburg (2017.10.25-2017.10.27)] 2017 IEEE II International Conference on Control in Technical Systems (CTS) - Diagnostics of control systems subject to fault signals
Guzaev, E. V., Imaev, D. Kh., Korablev, Yu. A., Shestopalov, M. Yu.Year:
2017
Language:
english
DOI:
10.1109/ctsys.2017.8109484
File:
PDF, 189 KB
english, 2017