![](/img/cover-not-exists.png)
[IEEE 2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM) - Nanjing (2017.11.8-2017.11.11)] 2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM) - Study on fault diagnosis method of transformer using multi-neural network and evidence theory
Wang, Wei, Zhang, Na, Liu, Xing-Ting, Han, Yu, Tao, Wen-BiaoYear:
2017
Language:
english
DOI:
10.1109/icam.2017.8242172
File:
PDF, 244 KB
english, 2017