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[IEEE 2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM) - Nanjing (2017.11.8-2017.11.11)] 2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM) - Reason analysis and countermeasure of opening failure of 220 kV circuit breaker
Wang, Wei, Yan, Lin, Zhang, Na, Yu, Hua, Tao, Wen-biaoYear:
2017
Language:
english
DOI:
10.1109/icam.2017.8242173
File:
PDF, 250 KB
english, 2017