[IEEE 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Hangzhou, China (2016.10.25-2016.10.28)] 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Mind the drain from strain: Effects of strain on the leakage current of Si diodes
Murphy-Armando, Felipe, Liu, Chang, Zhao, Yi, Duffy, RayYear:
2016
Language:
english
DOI:
10.1109/icsict.2016.7999046
File:
PDF, 624 KB
english, 2016