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[IEEE IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Beijing (2017.10.29-2017.11.1)] IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - A data center model for testing control and optimization algorithms
Garcia-Gabin, Winston, Berglund, Erik, Zhang, Huang, Mishchenko, Kateryna, Zhang, XiaojingYear:
2017
Language:
english
DOI:
10.1109/iecon.2017.8217254
File:
PDF, 223 KB
english, 2017