A Thermodynamic Perspective of Negative-Capacitance...

IEEE Journal on Exploratory Solid-State Computational Devices and Circuits 2017 / 12 Vol. 3

A Thermodynamic Perspective of Negative-Capacitance Field-Effect Transistors

Chang, Sou-Chi, Avci, Uygar E., Nikonov, Dmitri E., Young, Ian A.
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Volume:
3
Language:
english
Journal:
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
DOI:
10.1109/jxcdc.2017.2750108
Date:
December, 2017
File:
PDF, 1.26 MB
english, 2017
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