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Uniaxial Strain Induced Critical Current Degradation of Ag-Sheathed Bi-2212 Round Wire
Dai, Chao, Qin, Jinggang, Liu, Bo, Liu, Peihang, Wu, Yu, Nijhuis, Arend, Zhou, Chao, Li, Chenshan, Hao, Qingbin, Liu, ShengVolume:
28
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/tasc.2017.2787133
Date:
April, 2018
File:
PDF, 672 KB
english, 2018