Fatigue Life Analysis of Solder Joints in Flip Chip Bonding
Tsukada, Yutaka, Nishimura, Hideo, Sakane, Masao, Ohnami, MasateruVolume:
122
Year:
2000
Language:
english
Journal:
Journal of Electronic Packaging
DOI:
10.1115/1.1286002
File:
PDF, 759 KB
english, 2000