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[IEEE 2017 Silicon Nanoelectronics Workshop (SNW) - Kyoto (2017.6.4-2017.6.5)] 2017 Silicon Nanoelectronics Workshop (SNW) - Analysis of self-heating effects in vertical MOSFETs according to device geometry
Myeong, Ilho, Son, Dokyun, Kim, Hyunsuk, Kang, Myounggon, Shin, HyungcheolYear:
2017
Language:
english
DOI:
10.23919/SNW.2017.8242299
File:
PDF, 1.23 MB
english, 2017