Static measurements of GaN MESFETs on (111) Si substrates

Hoël, V., Guhel, Y., Boudart, B., Gaquière, C., De Jaeger, J.C., Lahrèche, H., Gibart, P.

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Volume:

Year:

2001

Language:

english

Journal:

Electronics Letters

DOI:

10.1049/el:20010740

File:

PDF, 308 KB

english, 2001

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