![](/img/cover-not-exists.png)
Static measurements of GaN MESFETs on (111) Si substrates
Hoël, V., Guhel, Y., Boudart, B., Gaquière, C., De Jaeger, J.C., Lahrèche, H., Gibart, P.Volume:
37
Year:
2001
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:20010740
File:
PDF, 308 KB
english, 2001