[IEEE 2008 Conference on Lasers and Electro-Optics (CLEO) - San Jose, CA, USA (2008.05.4-2008.05.9)] 2008 Conference on Lasers and Electro-Optics - Advanced length metrology exploiting the frequency comb of a femtosecond laser
Young-Jin Kim,, Jonghan Jin,, Yunseok Kim,, Sangwon Hyun,, Seung-Woo Kim,Year:
2008
Language:
english
DOI:
10.1109/CLEO.2008.4552053
File:
PDF, 128 KB
english, 2008