[IEEE 2017 International Conference on Electrical and Information Technologies (ICEIT) - Rabat (2017.11.15-2017.11.18)] 2017 International Conference on Electrical and Information Technologies (ICEIT) - A new extraction method of SiC power MOSFET threshold voltage using a physical approach
Jouha, Wadia, Oualkadi, Ahmed El, Dherbecourt, Pascal, Joubert, Eric, Masmoudi, MohamedYear:
2017
Language:
english
DOI:
10.1109/EITech.2017.8255289
File:
PDF, 1.29 MB
english, 2017