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[IEEE 2017 International Test Conference in Asia (ITC-Asia) - Taipei (2017.9.13-2017.9.15)] 2017 International Test Conference in Asia (ITC-Asia) - Enhancing security of logic encryption using embedded key generation unit
Karmakar, Rajit, Chattopadhyay, Santanu, Kapur, RohitYear:
2017
Language:
english
DOI:
10.1109/ITC-ASIA.2017.8097127
File:
PDF, 228 KB
english, 2017