Run-time reconfigurable instruments for advanced...

IEEE Instrumentation & Measurement Magazine 2017 / 8 Vol. 20; Iss. 4

Run-time reconfigurable instruments for advanced board-level testing

Aleksejev, Igor, Jutman, Artur, Devadze, Sergei
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Volume:
20
Language:
english
Journal:
IEEE Instrumentation & Measurement Magazine
DOI:
10.1109/MIM.2017.8006390
Date:
August, 2017
File:
PDF, 451 KB
english, 2017
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