[IEEE Comput. Soc 1999 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (9-10 Aug. 1999)] Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing - Determining redundancy requirements for memory arrays with critical area analysis
Segal, J.D., Bakarian, S., Colburn, J.E., Kumar, M., Hong, C., Shubat, A.Year:
1999
Language:
english
DOI:
10.1109/MTDT.1999.782683
File:
PDF, 116 KB
english, 1999