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[IEEE 2017 IEEE International Autumn Meeting on Power, Electronics and Computing (ROPEC) - Ixtapa (2017.11.8-2017.11.10)] 2017 IEEE International Autumn Meeting on Power, Electronics and Computing (ROPEC) - Classification of partial discharge in pin type insulators using fingerprints and neural networks
Quizhpi-Cuesta, M., Gomez-Juca, F., Orozco-Tupacyupanqui, W., Quizhpi-Palomeque, F.Year:
2017
Language:
english
DOI:
10.1109/ROPEC.2017.8261653
File:
PDF, 623 KB
english, 2017