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[IEEE 2017 IEEE International Autumn Meeting on Power, Electronics and Computing (ROPEC) - Ixtapa, Mexico (2017.11.8-2017.11.10)] 2017 IEEE International Autumn Meeting on Power, Electronics and Computing (ROPEC) - Mobility extraction for 24-nm-channel length n-MOS using the RFCV technique: Effect of the fabrication process
Trojman, Lionel, Benalcazar, Diego R., Procel, Luis M., Jobard, GuillaumeYear:
2017
Language:
english
DOI:
10.1109/ROPEC.2017.8261677
File:
PDF, 210 KB
english, 2017