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[IEEE TENCON 2017 - 2017 IEEE Region 10 Conference - Penang (2017.11.5-2017.11.8)] TENCON 2017 - 2017 IEEE Region 10 Conference - Examination of sub-stroke and face authentication for e-Testing
Kawamata, Taisuke, Akakura, TakakoYear:
2017
Language:
english
DOI:
10.1109/TENCON.2017.8227848
File:
PDF, 1008 KB
english, 2017