[IEEE 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) - Seoul, South Korea (2017.6.20-2017.6.23)] 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) - A consideration of mechanism of audio signa deterioration caused by propagation noise between audio equipment
Fujino, Takahiro, Yoshida, TakahiroYear:
2017
Language:
english
DOI:
10.1109/apemc.2017.7975450
File:
PDF, 773 KB
english, 2017