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[ACM 2001. 38th Design Automation Conference - Las Vegas, NV, USA (18-22 June 2001)] Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232) - Mismatch analysis and direct yield optimization by spec-wise linearization and feasibility-guided search
Schenkel, F., Pronath, M., Zizala, S., Schwencker, R., Graeb, H., Antreich, K.Year:
2001
Language:
english
DOI:
10.1109/dac.2001.935625
File:
PDF, 656 KB
english, 2001