[IEEE 2017 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM) - Toronto, ON (2017.11.9-2017.11.10)] 2017 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM) - STRESS: A Semi-Automated, Fully Replicable Approach for Project Selection
Falessi, Davide, Smith, Wyatt, Serebrenik, AlexanderYear:
2017
Language:
english
DOI:
10.1109/esem.2017.22
File:
PDF, 490 KB
english, 2017