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[IEEE IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) - St. Paul, MN, USA (18-21 May 1998)] IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) - Some aspects of pseudo random binary array based surface characterization
Spoelder, H.J.W., Vos, F.M., Petriu, E.M., Groen, F.C.A.Volume:
1
Year:
1998
Language:
english
DOI:
10.1109/imtc.1998.679629
File:
PDF, 644 KB
english, 1998