[IEEE 2017 International Test Conference in Asia (ITC-Asia) - Taipei (2017.9.13-2017.9.15)] 2017 International Test Conference in Asia (ITC-Asia) - Software-hardware-cooperated built-in self-test scheme for channel-based DRAMs
Hsieh, Tsung-Fu, Li, Jin-Fu, Wu, Kuan-Te, Lai, Jenn-Shiang, Lo, Chih-Yen, Kwai, Ding-Ming, Chou, Yung-FaYear:
2017
Language:
english
DOI:
10.1109/itc-asia.2017.8097122
File:
PDF, 112 KB
english, 2017