Experimental Investigations of State-of-the-Art 650-V Class Power MOSFETs for Cryogenic Power Conversion at 77K
Chen, Yu, Chen, Xiao-Yuan, Li, Tao, Feng, Ying-Jun, Liu, Yang, Huang, Qin, Li, Meng-Yao, Zeng, LeiVolume:
6
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/jeds.2017.2761451
Date:
December, 2018
File:
PDF, 2.19 MB
english, 2018