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[Springer Proceedings in Physics] X-Ray Lasers 2016 Volume 202 || In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector
Kawachi, Tetsuya, Bulanov, Sergei V., Daido, Hiroyuki, Kato, YoshiakiVolume:
10.1007/97
Year:
2018
Language:
english
DOI:
10.1007/978-3-319-73025-7_17
File:
PDF, 261 KB
english, 2018