Investigation on interface-related defects by...

Journal of Luminescence 2018 / 2

Investigation on interface-related defects by photoluminescence of cubic (Al)GaN/AlN multi-quantum wells structures

Herval, Leonilson K.S., de Godoy, Marcio P.F., Wecker, Tobias, As, Donat J.
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Language:
english
Journal:
Journal of Luminescence
DOI:
10.1016/j.jlumin.2018.02.051
Date:
February, 2018
File:
PDF, 1.23 MB
english, 2018
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