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Cyclical Annealing Technique To Enhance Reliability of Amorphous Metal Oxide Thin Film Transistors
Chen, Hong-Chih, Chang, Ting-Chang, Lai, Wei-Chih, Chen, Guan-Fu, Chen, Bo-Wei, Hung, Yu-Ju, Chang, Kuo-Jui, Cheng, Kai-Chung, Huang, Chen-Shuo, Chen, Kuo-Kuang, Lu, Hsueh-Hsing, Lin, Yu-HsinLanguage:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.7b16307
Date:
February, 2018
File:
PDF, 2.59 MB
english, 2018