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Impact of ultra-thinning on DC characteristics of MOSFET devices
Pinel, S., Lépinois, F., Cazarré, A., Tasselli, J., Marty, A., Bailbé, J. P.Volume:
17
Language:
english
Journal:
The European Physical Journal Applied Physics
DOI:
10.1051/epjap:2001011
Date:
January, 2002
File:
PDF, 120 KB
english, 2002