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[IEEE 2017 International Conference on Trends in Electronics and Informatics (ICOEI) - Tirunelveli, India (2017.5.11-2017.5.12)] 2017 International Conference on Trends in Electronics and Informatics (ICEI) - Low leakage write-enhanced robust 11T SRAM cell with fully half-select-free operation
Ahmad, Sayeed, Alam, Naushad, Hasan, Mohd.Year:
2017
Language:
english
DOI:
10.1109/ICOEI.2017.8300960
File:
PDF, 338 KB
english, 2017