[IEEE 2017 IEEE International Electron Devices Meeting...

  • Main
  • [IEEE 2017 IEEE International Electron...

[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - Thermal effects in 3D sequential technology

Triantopoulos, K., Casse, M., Brunet, L., Batude, P., Fenouillet-Beranger, C., Mathieu, B., Vinet, M., Ghibaudo, G., Reimbold, G.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
DOI:
10.1109/IEDM.2017.8268348
File:
PDF, 857 KB
2017
Conversion to is in progress
Conversion to is failed