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[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - Perspective of negative capacitance FinFETs investigated by transient TCAD simulation
Ota, Hiroyuki, Fukuda, Koichi, Ikegami, Tsutomu, Hattori, Junichi, Asai, Hidehiro, Migita, Shinji, Toriumi, AkiraYear:
2017
Language:
english
DOI:
10.1109/IEDM.2017.8268394
File:
PDF, 1.26 MB
english, 2017