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[IEEE 2017 IEEE International Conference on Systems, Man and Cybernetics (SMC) - Banff, AB (2017.10.5-2017.10.8)] 2017 IEEE International Conference on Systems, Man, and Cybernetics (SMC) - A review of broad technology assessment: Citation-based analysis
Lu, Louis Y. Y., Liu, John S.Year:
2017
Language:
english
DOI:
10.1109/SMC.2017.8123071
File:
PDF, 389 KB
english, 2017