[IEEE 2017 IEEE International Conference on Systems, Man...

  • Main
  • [IEEE 2017 IEEE International...

[IEEE 2017 IEEE International Conference on Systems, Man and Cybernetics (SMC) - Banff, AB (2017.10.5-2017.10.8)] 2017 IEEE International Conference on Systems, Man, and Cybernetics (SMC) - A review of broad technology assessment: Citation-based analysis

Lu, Louis Y. Y., Liu, John S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
DOI:
10.1109/SMC.2017.8123071
File:
PDF, 389 KB
english, 2017
Conversion to is in progress
Conversion to is failed