Optimization of Au-Free Ohmic Contact Based on the...

IEEE Transactions on Electron Devices 2018 / 2 Vol. 65; Iss. 2

Optimization of Au-Free Ohmic Contact Based on the Gate-First Double-Metal AlGaN/GaN MIS-HEMTs and SBDs Process

Sun, Hui, Liu, Meihua, Liu, Peng, Lin, Xinnan, Chen, Jianguo, Wang, Maojun, Chen, Dongmin
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Volume:
65
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2778072
Date:
February, 2018
File:
PDF, 3.50 MB
english, 2018
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