[IEEE 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE) - Angers (2017.9.4-2017.9.7)] 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE - A De-embedding application for EMC attenuation measurements of components
Hein, Janne, Hippeli, Johannes, Eibert, Thomas F.Year:
2017
Language:
english
DOI:
10.1109/emceurope.2017.8094678
File:
PDF, 809 KB
english, 2017