[IEEE 2017 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM) - Toronto, ON (2017.11.9-2017.11.10)] 2017 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM) - The Impact of Coverage on Bug Density in a Large Industrial Software Project
Bach, Thomas, Andrzejak, Artur, Pannemans, Ralf, Lo, DavidYear:
2017
Language:
english
DOI:
10.1109/esem.2017.44
File:
PDF, 1.59 MB
english, 2017