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[IEEE 2017 International Conference on System Science and Engineering (ICSSE) - Ho Chi Minh City, Vietnam (2017.7.21-2017.7.23)] 2017 International Conference on System Science and Engineering (ICSSE) - Statistical analysis on variation tolerance of time-shared Twin Memristor Crossbar for pattern matching
Truong, Son Ngoc, Pham, Khoa Van, Yang, Wonsun, Min, Kyeong-SikYear:
2017
Language:
english
DOI:
10.1109/icsse.2017.8030931
File:
PDF, 3.67 MB
english, 2017