[IEEE 2017 IEEE International Test Conference (ITC) - Fort...

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[IEEE 2017 IEEE International Test Conference (ITC) - Fort Worth, TX (2017.10.31-2017.11.2)] 2017 IEEE International Test Conference (ITC) - Low cost dynamic error detection in linearity testing of SAR ADCs

Jain, Nimit, Agarwal, Nitin, Thinakaran, Rajavelu, Parekhji, Rubin
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Year:
2017
Language:
english
DOI:
10.1109/test.2017.8242030
File:
PDF, 266 KB
english, 2017
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