Nanoislands-Based Charge Trapping Memory: A Scalability Study
El-Atab, Nazek, Saadat, Irfan, Saraswat, Krishna, Nayfeh, AmmarVolume:
16
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/tnano.2017.2764745
Date:
November, 2017
File:
PDF, 341 KB
english, 2017