Structurally Controlled Large-Area 10-nm-Pitch Graphene Nanomesh by Focused Helium Ion Beam Milling
Schmidt, Marek Edward, Iwasaki, Takuya, Muruganathan, Manoharan, Haque, Mayeesha, Ngoc, Huynh Van, Ogawa, Shinichi, Mizuta, HiroshiLanguage:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.8b00427
Date:
February, 2018
File:
PDF, 2.74 MB
english, 2018