Approach for improved positioning of an atomic force...

Approach for improved positioning of an atomic force microscope piezoelectric tube scanner

Petersen, Ian R., Pota, Hemanshu R., Rana, Md Sohel
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Volume:
9
Language:
english
Journal:
Micro & Nano Letters
DOI:
10.1049/mnl.2014.0104
Date:
June, 2014
File:
PDF, 664 KB
english, 2014
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