Bayesian Assessment of a Binary Measurement System with...

American Journal of Mathematical and Management Sciences 2017 / 10 Vol. 36; Iss. 4

Bayesian Assessment of a Binary Measurement System with Baseline Data

Eschmann, Mark, Stamey, James D., Young, Phil D.
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Volume:
36
Language:
english
Journal:
American Journal of Mathematical and Management Sciences
DOI:
10.1080/01966324.2017.1338976
Date:
October, 2017
File:
PDF, 864 KB
english, 2017
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