[IEEE 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE) - Angers (2017.9.4-2017.9.7)] 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test
Lambrecht, Niels, De Zutter, Daniel, Vande Ginste, Dries, Pues, HugoYear:
2017
Language:
english
DOI:
10.1109/EMCEurope.2017.8094745
File:
PDF, 865 KB
english, 2017