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[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Top gate graphene field effect transistor on flexible substrate by using one-step fluorinated graphene as dielectrics
Sahoo, Mamina, Fei-Hou,, Liu, Zhiwei, Lai, Chao-SungYear:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060195
File:
PDF, 334 KB
english, 2017