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Hot-Carrier Degradation in Power LDMOS: Selective LOCOS- Versus STI-Based Architecture
Tallarico, Andrea Natale, Reggiani, Susanna, Depetro, Riccardo, Torti, Andrea Mario, Croce, Giuseppe, Sangiorgi, Enrico, Fiegna, ClaudioVolume:
6
Year:
2018
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2018.2792539
File:
PDF, 1.31 MB
english, 2018