[IEEE 2017 New York Scientific Data Summit (NYSDS) - New York, NY, USA (2017.8.6-2017.8.9)] 2017 New York Scientific Data Summit (NYSDS) - Capturing provenance as a diagnostic tool for workflow performance evaluation and optimization
Pouchard, Line, Malik, Abid, Dam, Huub Van, Xie, Cong, Xu, Wei, Van Dam, Kerstin KleeseYear:
2017
Language:
english
DOI:
10.1109/NYSDS.2017.8085043
File:
PDF, 980 KB
english, 2017