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[IEEE 2017 International Semiconductor Conference (CAS) - Sinaia (2017.10.11-2017.10.14)] 2017 International Semiconductor Conference (CAS) - Evaluating the switching mode power supplies used in radiation hardness tests of integrated circuits
Placinta, V. M., Cojocariu, L. N., Ravariu, C.Year:
2017
Language:
english
DOI:
10.1109/SMICND.2017.8101232
File:
PDF, 431 KB
english, 2017