VAET-STT: Variation Aware STT-MRAM Analysis and Design...

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2017

VAET-STT: Variation Aware STT-MRAM Analysis and Design Space Exploration Tool

Nair, Sarath Mohanachandran, Bishnoi, Rajendra, Golanbari, Mohammad Saber, Oboril, Fabian, Hameed, Fazal, Tahoori, Mehdi B.
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2017.2760861
File:
PDF, 2.92 MB
english, 2017
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