[Int. Test Conference International Test Conference 1996....

[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - A unified framework for design validation and manufacturing test

Moundanos, D., Abraham, J.A., Heskote, Y.V.

How much do you like this book?

What’s the quality of the file?

Download the book for quality assessment

What’s the quality of the downloaded files?

Year:

1996

Language:

english

DOI:

10.1109/TEST.1996.557149

File:

PDF, 1013 KB

english, 1996

Conversion to is in progress

Conversion to is failed