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[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - A unified framework for design validation and manufacturing test
Moundanos, D., Abraham, J.A., Heskote, Y.V.Year:
1996
Language:
english
DOI:
10.1109/TEST.1996.557149
File:
PDF, 1013 KB
english, 1996