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[IEEE Comput. Soc 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Albuquerque, NM, USA (1-3 Nov. 1999)] Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) - Increase the behavioral fault model accuracy using high-level synthesis information

Brera, M., Ferrandi, F., Sciuto, D., Fummi, F.
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Year:
1999
Language:
english
DOI:
10.1109/dftvs.1999.802883
File:
PDF, 37 KB
english, 1999
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